DocumentCode :
2261556
Title :
Efficient identification of crosstalk induced slowdown targets
Author :
Breuer, Melvin A. ; Gupta, Sandeep K. ; Nazarian, Shahin
Author_Institution :
Dept. of Electr. Eng. Syst., Southern California Univ., Los Angeles, CA, USA
fYear :
2004
fDate :
15-17 Nov. 2004
Firstpage :
124
Lastpage :
131
Abstract :
This paper deals with filter development in XIDEN, a "pruning " tool used to identify crosstalk targets that can potentially create Boolean errors. XIDEN employs multiple tools to adoptively estimate and/or extract electrical parameters required by its filters, and uses a novel approach to construct an efficient sequence of extractors and filters that are applied to a circuit. Thus, an initially enormous collection of targets can usually be reduced to a very small set of targets via a vectorless process. This process flow is much more efficient than using ATPG without pruning to identify targets that represent faults. The XIDEN framework, including the filters that capture the effect of crosstalk-induced pulses, has been previously presented. In this paper, our focus is on filters associated with crosstalk induced slowdown targets. To accurately compute timing information associated with signal transitions, we have enhanced the XIDEN framework with enhanced static timing analysis procedures that take into consideration single and multiple capacitive crosstalk couplings in a circuit.
Keywords :
circuit analysis computing; crosstalk; filters; integrated circuit testing; logic testing; timing circuits; Boolean errors; XIDEN framework; crosstalk induced slowdown targets; crosstalk target identification; extractors; filter development; multiple capacitive crosstalk coupling; required time; signal transitions; single capacitive crosstalk coupling; slow-down effect; static timing analysis; vectorless process; Automatic test pattern generation; Circuit analysis computing; Circuit faults; Coupling circuits; Crosstalk; Fault diagnosis; Filters; Information analysis; Signal analysis; Timing; Crosstalk; extractors; filters; required time; slow-down effect; static timing analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2004. 13th Asian
ISSN :
1081-7735
Print_ISBN :
0-7695-2235-1
Type :
conf
DOI :
10.1109/ATS.2004.38
Filename :
1376547
Link To Document :
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