• DocumentCode
    2261716
  • Title

    A snapshot method to provide full visibility for functional debugging using FPGA

  • Author

    Chuang, Chin-Lung ; Lu, Dong-Jung ; Liu, Chein-Nan Jimmy

  • Author_Institution
    Dept. of Electr. Eng., National Central Univ., Taiwan
  • fYear
    2004
  • fDate
    15-17 Nov. 2004
  • Firstpage
    164
  • Lastpage
    169
  • Abstract
    Until now, logic simulators are still the most popular verification tools. Although they can provide full controllability and observability during the verification process, the simulation speed is too slow for large amounts of input patterns. Using hardware emulation such as FPGA can have higher simulation speed. However, it is very hard to debug using this approach due to poor visibility in FPGAs. Therefore, in this paper, we propose another approach to "record" the internal behaviors of a FPGA and "replay" the interesting period of time in a software simulator. In this way, we can still have high simulation speed because most simulation efforts are still finished in FPGA. Moreover, full visibility and better debugging environment can be provided in the software simulation. The experimental results have shown the efficiency of using our approach.
  • Keywords
    circuit analysis computing; field programmable gate arrays; integrated circuit testing; logic simulation; logic testing; FPGA; field programmable gate array; full visibility; functional debugging; hardware emulation; input patterns; logic simulators; snapshot method; software simulator; verification tool; Debugging; Field programmable gate arrays; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2004. 13th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2235-1
  • Type

    conf

  • DOI
    10.1109/ATS.2004.15
  • Filename
    1376553