Reliability study of shape factors on metal-insulator-metal (MIM) capacitors

In this work a linear field model is adopted to study the reliability of capacitors which are manufacturing in Win´s production line. Two testing techniques, a constant voltage and a ramped voltage testing modes, are compared in order to examine in various sizes and shapes which testing techniques may give us a better way to predict the capacitor lifetime. It seems to us that the constant voltage test can give us an appropriate way for predicting the reliability of capacitors.