Title :
Impact of process parameter variations on the energy dissipation in adiabatic logic
Author :
Fischer, Juergen ; Amirante, Ettore ; Nirschl, Thomas ; Teichmann, Philip ; Schmitt-Landsiedel, Doris ; Henzler, Stephan
Author_Institution :
Inst. for Tech. Electron., Munich Tech. Univ., Germany
fDate :
28 Aug.-2 Sept. 2005
Abstract :
Adiabatic logic offers high energy savings compared to standard CMOS at moderate operating speeds. Until now, only rudimentary investigations of the robustness of adiabatic circuits were presented. However, in deep sub-micron technologies the deviation of the device parameters from their nominal value is of crucial importance. By means of Monte-Carlo simulations in a 130nm CMOS technology, the impact of the process parameter variations on the energy dissipation is derived, where both global and local variations are considered. Comparing the energy dissipation of the 97.7% percentiles of adiabatic families with the ones for static CMOS, energy savings up to a factor of 10 are observed.
Keywords :
CMOS logic circuits; Monte Carlo methods; 130 nm; CMOS technology; Monte-Carlo simulation; adiabatic circuits; adiabatic logic; energy dissipation; process parameter variations; CMOS logic circuits; CMOS technology; Energy dissipation; Feedback; Frequency; Leakage current; Logic circuits; MOSFET circuits; Rails; Threshold voltage;
Conference_Titel :
Circuit Theory and Design, 2005. Proceedings of the 2005 European Conference on
Print_ISBN :
0-7803-9066-0
DOI :
10.1109/ECCTD.2005.1523152