Title :
High temperature RF operation: Effects on reliability analysis
Abstract :
(1) Standard testing protocol have been to test successful products - DC Arrhenius for lifetime projections - RFOLT for field/current effects at normal operating conditions (2) Elevated temperature RF operations shrinks the dynamic RF envelope - Reduced peak currents and voltage (3) Field degradation mechanisms complicate Arrhenius analysis - Simple model is not sufficient (4) Non-temperature related degradation mechanisms can have a significant effect under AC conditions.
Keywords :
reliability; testing; DC Arrhenius; RF operation life test; RFOLT; field degradation; reliability analysis; standard testing protocol; Degradation; Equations; Gallium nitride; Life estimation; Life testing; Power generation; Radio frequency; Stress; Temperature distribution; Voltage;
Conference_Titel :
Reliability of Compound Semiconductors Digest (ROCS), 2009
Conference_Location :
Greensboro, NC
Print_ISBN :
978-0-7908-0124-7
