DocumentCode
2262144
Title
A novel approach in polarimetric covariance matrix eigendecomposition
Author
Praks, Jan ; Hallikainen, Martti
Author_Institution
Lab. of Space Technol., Helsinki Univ. of Technol., Espoo, Finland
Volume
3
fYear
2000
fDate
2000
Firstpage
1119
Abstract
A new concept, the power normalized coherency matrix, is introduced to clarify the eigenvalue problem definition in SAR polarimetry. It is shown that the elements of the power normalized coherency matrix are good descriptors of polarimetric properties of SAR targets. An alternative scheme to alpha-entropy classification is proposed. It is shown that target entropy is closely related to the normalised coherency matrix determinant and the average alpha angle is related to the first element of the coherency matrix. This suggests that complicated eigenvalue calculations are not necessary in some SAR classification problems. The results also show that the average alpha and entropy parameters do not describe eigenvalue decomposition well, as similar parameters can be calculated without eigendecomposition. All results derived in this paper are based on general properties of Hermitian matrices
Keywords
covariance matrices; eigenvalues and eigenfunctions; geophysical techniques; radar imaging; radar polarimetry; radar theory; remote sensing by radar; synthetic aperture radar; terrain mapping; Hermitian matrices; SAR; SAR polarimetry; decomposition; eigenvalue decomposition; eigenvalue problem; geophysical measurement technique; land surface; normalised coherency matrix determinant; polarimetric covariance matrix eigendecomposition; power normalized coherency matrix; radar imaging; radar polarimetry; radar remote sensing; target entropy; terrain mapping; Covariance matrix; Eigenvalues and eigenfunctions; Entropy; Laboratories; Matrix decomposition; Polarimetry; Remote sensing; Scattering; Software algorithms; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location
Honolulu, HI
Print_ISBN
0-7803-6359-0
Type
conf
DOI
10.1109/IGARSS.2000.858041
Filename
858041
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