DocumentCode :
2262209
Title :
Optimized metrology for accurate laser damage measurements
Author :
Gallais, L. ; Natoli, J.Y.
Author_Institution :
Ecole Nationale Superieure de Phys. de Marseille, CNRS, Marseille, France
fYear :
2002
fDate :
24-24 May 2002
Firstpage :
98
Abstract :
Summary form only given. Laser induced damage threshold is linked to many factors such as the damage criteria, test procedure, pulse duration, spot size, and wavelength. This induces difficulty to make comparisons, or compilations of results and reach on an absolute measurement. This absolute measurement of laser damage requires a high level of sensitivity and a perfect knowledge of the apparatus characteristics. In this context we have upgrade the metrology of our set up to control and know the influence of each parameter on laser-induced damage threshold measurement.
Keywords :
laser beam effects; measurement errors; optimisation; sensitivity; absolute measurement; accurate laser damage measurements; apparatus characteristics; damage criteria; laser induced damage threshold; laser-induced damage threshold measurement; optimized metrology; pulse duration; sensitivity; spot size; test procedure; Atomic measurements; Laser beams; Laser theory; Metrology; Optical pulses; Optimized production technology; Pulse measurements; Testing; Waveguide lasers; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
Type :
conf
DOI :
10.1109/CLEO.2002.1033482
Filename :
1033482
Link To Document :
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