Title :
A unified built-in-test scheme: UBIST
Author_Institution :
TIM3/IMAG, Grenoble, France
Abstract :
An original BIST (built-in self-test) scheme is proposed to cover some shortcomings of self-checking circuits and to ensure all tests needed for integrated circuits. In the BIST scheme, self-checking techniques and built-in self-test techniques are combined in an original way and take advantage one from the other. This results in a unified BIST scheme (UBIST), allowing a high fault coverage for all tests needed for integrated circuits, e.g. offline test (design verification, manufacturing test, and maintenance test) and online concurrent error detection.<>
Keywords :
integrated circuit testing; integrated logic circuits; logic testing; UBIST; integrated circuits; self-checking circuits; unified built-in-test scheme; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Fault detection; Phase detection; Safety; Signal generators; Test pattern generators;
Conference_Titel :
Fault-Tolerant Computing, 1988. FTCS-18, Digest of Papers., Eighteenth International Symposium on
Conference_Location :
Tokyo, Japan
Print_ISBN :
0-8186-0867-6
DOI :
10.1109/FTCS.1988.5314
