DocumentCode
2262359
Title
A high temperature pressure sensor with β-SiC piezoresistors on SOI substrates
Author
Ziermann, René ; Von Berg, Jochen ; Reichert, Walter ; Obermeier, Ernst ; Eickhoff, Martin ; Krötz, Gerhard
Author_Institution
Microsensor & Actuator Technol. Center, Tech. Univ. of Berlin, Germany
Volume
2
fYear
1997
fDate
16-19 Jun 1997
Firstpage
1411
Abstract
This paper reports about the first piezoresistive pressure sensor for high operating temperatures using single crystalline, n-type β-SiC piezoresistors on Silicon On Insulator (SOI) substrates. The new Silicon Carbide On Insulator (SiCOI) layer structure prevents a leakage current flow through the substrate at high temperatures up to 723 K. The sensor was tested in the temperature range between room temperature and 573 K. The sensitivity of the device at room temperature is approximately 20.2 μV/VkPa. This corresponds to a longitudinal gauge factor of -32 in the [100]-direction. The Temperature Coefficient of Sensitivity (TCS) is -0.16 %K-1 at 573 K
Keywords
electric sensing devices; microsensors; piezoresistive devices; pressure sensors; semiconductor materials; silicon compounds; silicon-on-insulator; 293 to 723 K; SOI substrates; SiC; high temperature pressure sensor; longitudinal gauge factor; piezoresistors; sensitivity; temperature coefficient of sensitivity; Crystallization; Insulation; Insulator testing; Leakage current; Piezoresistance; Piezoresistive devices; Silicon carbide; Silicon on insulator technology; Temperature distribution; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
Conference_Location
Chicago, IL
Print_ISBN
0-7803-3829-4
Type
conf
DOI
10.1109/SENSOR.1997.635502
Filename
635502
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