• DocumentCode
    2262359
  • Title

    A high temperature pressure sensor with β-SiC piezoresistors on SOI substrates

  • Author

    Ziermann, René ; Von Berg, Jochen ; Reichert, Walter ; Obermeier, Ernst ; Eickhoff, Martin ; Krötz, Gerhard

  • Author_Institution
    Microsensor & Actuator Technol. Center, Tech. Univ. of Berlin, Germany
  • Volume
    2
  • fYear
    1997
  • fDate
    16-19 Jun 1997
  • Firstpage
    1411
  • Abstract
    This paper reports about the first piezoresistive pressure sensor for high operating temperatures using single crystalline, n-type β-SiC piezoresistors on Silicon On Insulator (SOI) substrates. The new Silicon Carbide On Insulator (SiCOI) layer structure prevents a leakage current flow through the substrate at high temperatures up to 723 K. The sensor was tested in the temperature range between room temperature and 573 K. The sensitivity of the device at room temperature is approximately 20.2 μV/VkPa. This corresponds to a longitudinal gauge factor of -32 in the [100]-direction. The Temperature Coefficient of Sensitivity (TCS) is -0.16 %K-1 at 573 K
  • Keywords
    electric sensing devices; microsensors; piezoresistive devices; pressure sensors; semiconductor materials; silicon compounds; silicon-on-insulator; 293 to 723 K; SOI substrates; SiC; high temperature pressure sensor; longitudinal gauge factor; piezoresistors; sensitivity; temperature coefficient of sensitivity; Crystallization; Insulation; Insulator testing; Leakage current; Piezoresistance; Piezoresistive devices; Silicon carbide; Silicon on insulator technology; Temperature distribution; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-3829-4
  • Type

    conf

  • DOI
    10.1109/SENSOR.1997.635502
  • Filename
    635502