• DocumentCode
    2262376
  • Title

    Development of a silicon BJT integrated circuit chip performance simulator

  • Author

    Goel, Ashok K.

  • Author_Institution
    Dept. of Electr. Eng., Michigan Technol. Univ., Houghton, MI, USA
  • fYear
    1993
  • fDate
    16-18 Aug 1993
  • Firstpage
    476
  • Abstract
    For integrated circuit chips based on the silicon bipolar junction transistor (BJT) technology, computer efficient models of the various chip performance indicators have been developed and a user-friendly computer program called “BCHIPSIM” suitable for the simulation of the chip performance indicators for a microprocessor or a gate-array chip has been developed. In addition to predicting the various chip performance indicators such as its maximum clock frequency, power consumption, computational capacity, power efficiency, fabrication yield, functional throughput rate and the size of the chip with the given technology parameters, the program has also been used to simulate the dependences the various chip performance indicators on the technology feature sizes in the range 0.1-5 μm and the chip integration levels in the range 100-1,000,000 logic gates on the chip
  • Keywords
    bipolar digital integrated circuits; circuit analysis computing; elemental semiconductors; logic arrays; microprocessor chips; silicon; software packages; BCHIPSIM; BJT integrated circuit chip; IC chip performance simulator; Si; bipolar junction transistor; computational capacity; computer efficient models; fabrication yield; functional throughput rate; gate-array chip; maximum clock frequency; microprocessor; power consumption; power efficiency; user-friendly computer program; Bipolar integrated circuits; Bipolar transistor circuits; Circuit simulation; Clocks; Computational modeling; Computer simulation; Integrated circuit modeling; Integrated circuit technology; Microprocessors; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., Proceedings of the 36th Midwest Symposium on
  • Conference_Location
    Detroit, MI
  • Print_ISBN
    0-7803-1760-2
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1993.343017
  • Filename
    343017