IEEE-1445 (DTIF) based digital test solution

The digital test interchange format (DTIF) is defined by the IEEE-1445 specification and provides a standardized digital data interchange format that can be used with various digital test environments. This standardized format, when used in conjunction with tools for post-processing of DTIF files and appropriate functional test digital hardware, offers a cost effective and viable solution for migrating legacy TPS´s to a modern digital test system platform. This paper provides an overview of how DTIF files generated by simulator tools such as Teradyne´s LASAR simulator can be used in conjunction with modern digital test post-processing tools and hardware to provide a robust TPS migration strategy for legacy digital test applications including support for Go / No-Go tests, guided probe and fault dictionary functionality. This methodology offers wide applicability for a number of applications that were originally developed on digital test platforms such as the GenRad 1795 / 1796 / 2225/ 2235/ 2750, the Hewlett Packard DTS-70, Teradyne L200 / L300, and Schlumberger 790.