DocumentCode :
2262393
Title :
EUV photoelectron micro-spectroscopy with a laser-produced plasma source
Author :
Nishigori, K. ; Lee, Daewoo ; Komiyama, K. ; Yashiro, Hitoshi ; Tomie, T.
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Ibaraki, Japan
fYear :
2002
fDate :
24-24 May 2002
Firstpage :
106
Abstract :
Summary form only given. In Tomie-type photoelectron spectroscopy, EUPS (EUV photoelectron spectroscopy), a laser-produced plasma emitting discrete emission lines is employed as an EUV source and a single narrow band line is selected using a filter with a high transmission. The electron energy spectrum is analyzed by a time-of-flight (TOF) method in which all electrons can be collected theoretically. Thus, high efficiencies in monochromatizing excitation photons and in analyzing electron energies should be realized. Very recently, we have successfully obtained a high energy resolution TOF photoelectron spectrum from a gold sample irradiated by a sub-micron 16-nm EUV beam focused with a Schwarzschild optic.
Keywords :
photoelectron microscopy; photoelectron spectroscopy; plasma production by laser; time of flight spectroscopy; ultraviolet photoelectron spectra; ultraviolet sources; 16 nm; Au; Au sample; EUV photoelectron micro-spectroscopy; EUV photoelectron spectroscopy; EUV source; Schwarzschild optic; Tomie-type photoelectron spectroscopy; discrete emission lines; electron energy analysis; electron energy spectrum; high energy resolution TOF photoelectron spectrum; laser-produced plasma source; single narrow band line; sub-micron EUV beam; time-of-flight method; Open wireless architecture; Optical arrays; Optical attenuators; Optical refraction; Optical surface waves; Optical variables control; Optical waveguides; Plasma sources; Shape; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
Type :
conf
DOI :
10.1109/CLEO.2002.1033491
Filename :
1033491
Link To Document :
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