• DocumentCode
    2262538
  • Title

    Wide spectral span Spectrum Analysis with an analog step and dwell translation pre-processor to a high dynamic range FFT based spectrum analyzer

  • Author

    Lowdermilk, Wade ; Harris, Fred

  • Author_Institution
    BAE Syst., San Diego, CA, USA
  • fYear
    2009
  • fDate
    14-17 Sept. 2009
  • Firstpage
    365
  • Lastpage
    368
  • Abstract
    This paper describes a new high speed spectrum analysis technique that tiles a spectral display using a rapid step and dwell spectral sweep. The step and dwell translation operates as a block down converter that translates successive frequency spans to an IF filter which is sampled, A-to-D converted, and processed by a high dynamic range FFT spectrum analyzer. The step and dwell sweep of the analog block down converter enables sequential spectral probes reminiscent of a swept frequency analyzer. The windowed FFT performed during the dwell synthesizes a parallel filter bank that partitions the spectral span into the same resolution bands as an FM spectral sweep through the same spectral span. By performing this second partition in parallel rather than sequentially we can reduce the time duration required to sweep the desired spectral span or we can implement post detection averaging by performing multiple FFTs during each dwell interval. The rapid spectral sweeps that can be realized by this technique make the analyzer well suited for analyzing transient and non periodic input signals.
  • Keywords
    analogue-digital conversion; fast Fourier transforms; spectral analysers; A-to-D converted; IF filter; analog block down converter; analog step pre-processor; block down converter; dwell translation pre-processor; dynamic range FFT spectrum analyzer; frequency analyzer; spectral display; wide spectral span spectrum analysis; Displays; Dynamic range; Filter bank; Flexible printed circuits; Frequency conversion; Probes; Signal analysis; Spectral analysis; Tiles; Transient analysis; component; spectral sweep; spectrum analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2009 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-4980-4
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2009.5314014
  • Filename
    5314014