Title :
Classification of sequential circuits based on τk notation
Author :
Ooi, Chia Yee ; Fujiwara, Hideo
Author_Institution :
Graduate Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Kansai Science City, Japan
Abstract :
In this paper, we introduce a new test generation complexity notation called τk notation, which consists of τk-equivalent and τk-bounded, in order to clarify the classification of sequential circuits based on combinational test generation complexity. We reconsider the test generation complexity for the existing classes of acyclic sequential circuits. Several new classes of sequential circuits that cover some cyclic sequential circuits have been identified as being τ-equivalent and τ-bounded.
Keywords :
automatic test pattern generation; circuit complexity; sequential circuits; τ-bounded; τ-equivalent; τk -bounded; τk -equivalent; τk notation; acyclic sequential circuits; combinational test generation complexity; sequential circuit classification; test generation complexity notation; Circuit faults; Circuit testing; Cities and towns; Combinational circuits; Information science; Logic arrays; Logic testing; Sequential analysis; Sequential circuits; Switching circuits;
Conference_Titel :
Test Symposium, 2004. 13th Asian
Print_ISBN :
0-7695-2235-1
DOI :
10.1109/ATS.2004.31
