• DocumentCode
    2262541
  • Title

    Classification of sequential circuits based on τk notation

  • Author

    Ooi, Chia Yee ; Fujiwara, Hideo

  • Author_Institution
    Graduate Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Kansai Science City, Japan
  • fYear
    2004
  • fDate
    15-17 Nov. 2004
  • Firstpage
    348
  • Lastpage
    353
  • Abstract
    In this paper, we introduce a new test generation complexity notation called τk notation, which consists of τk-equivalent and τk-bounded, in order to clarify the classification of sequential circuits based on combinational test generation complexity. We reconsider the test generation complexity for the existing classes of acyclic sequential circuits. Several new classes of sequential circuits that cover some cyclic sequential circuits have been identified as being τ-equivalent and τ-bounded.
  • Keywords
    automatic test pattern generation; circuit complexity; sequential circuits; τ-bounded; τ-equivalent; τk -bounded; τk -equivalent; τk notation; acyclic sequential circuits; combinational test generation complexity; sequential circuit classification; test generation complexity notation; Circuit faults; Circuit testing; Cities and towns; Combinational circuits; Information science; Logic arrays; Logic testing; Sequential analysis; Sequential circuits; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2004. 13th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2235-1
  • Type

    conf

  • DOI
    10.1109/ATS.2004.31
  • Filename
    1376583
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2262541