DocumentCode :
2262579
Title :
A new way of detecting reconvergent fanout branch pairs in logic circuits
Author :
Xu, Shiy ; Edirisuriya, E.
Author_Institution :
Shanghai Univ., China
fYear :
2004
fDate :
15-17 Nov. 2004
Firstpage :
354
Lastpage :
357
Abstract :
Reconvergent fanout has been one of the critical issues for testing of VLSI circuits and design for testability. In this paper we present a new algorithm, which detects all sources of reconvergent fanout branch pairs by processing a normal circuit description. The algorithm identifies all the gates at which reconvergence occurs, the reconvergent sites, and lists all the reconvergent fanout branch pairs that are reconvergent at these sites. The automatic detection of such reconvergence can be used for improving the testability analysis or assist test generation of circuits containing such fanout branches.
Keywords :
VLSI; design for testability; integrated circuit testing; logic circuits; logic testing; VLSI circuit testing; design for testability; logic circuits; normal circuit description; reconvergent fanout branch pairs; reconvergent sites; test generation; testability analysis; testable design; Automatic testing; Circuit testing; Design for testability; Feeds; Information analysis; Integrated circuit measurements; Logic circuits; Logic testing; Semiconductor device measurement; Very large scale integration; Fanout; Fanout branch; Reconvergence; Testability; Testable Design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2004. 13th Asian
ISSN :
1081-7735
Print_ISBN :
0-7695-2235-1
Type :
conf
DOI :
10.1109/ATS.2004.12
Filename :
1376584
Link To Document :
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