• DocumentCode
    2262579
  • Title

    A new way of detecting reconvergent fanout branch pairs in logic circuits

  • Author

    Xu, Shiy ; Edirisuriya, E.

  • Author_Institution
    Shanghai Univ., China
  • fYear
    2004
  • fDate
    15-17 Nov. 2004
  • Firstpage
    354
  • Lastpage
    357
  • Abstract
    Reconvergent fanout has been one of the critical issues for testing of VLSI circuits and design for testability. In this paper we present a new algorithm, which detects all sources of reconvergent fanout branch pairs by processing a normal circuit description. The algorithm identifies all the gates at which reconvergence occurs, the reconvergent sites, and lists all the reconvergent fanout branch pairs that are reconvergent at these sites. The automatic detection of such reconvergence can be used for improving the testability analysis or assist test generation of circuits containing such fanout branches.
  • Keywords
    VLSI; design for testability; integrated circuit testing; logic circuits; logic testing; VLSI circuit testing; design for testability; logic circuits; normal circuit description; reconvergent fanout branch pairs; reconvergent sites; test generation; testability analysis; testable design; Automatic testing; Circuit testing; Design for testability; Feeds; Information analysis; Integrated circuit measurements; Logic circuits; Logic testing; Semiconductor device measurement; Very large scale integration; Fanout; Fanout branch; Reconvergence; Testability; Testable Design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2004. 13th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2235-1
  • Type

    conf

  • DOI
    10.1109/ATS.2004.12
  • Filename
    1376584