DocumentCode
2262579
Title
A new way of detecting reconvergent fanout branch pairs in logic circuits
Author
Xu, Shiy ; Edirisuriya, E.
Author_Institution
Shanghai Univ., China
fYear
2004
fDate
15-17 Nov. 2004
Firstpage
354
Lastpage
357
Abstract
Reconvergent fanout has been one of the critical issues for testing of VLSI circuits and design for testability. In this paper we present a new algorithm, which detects all sources of reconvergent fanout branch pairs by processing a normal circuit description. The algorithm identifies all the gates at which reconvergence occurs, the reconvergent sites, and lists all the reconvergent fanout branch pairs that are reconvergent at these sites. The automatic detection of such reconvergence can be used for improving the testability analysis or assist test generation of circuits containing such fanout branches.
Keywords
VLSI; design for testability; integrated circuit testing; logic circuits; logic testing; VLSI circuit testing; design for testability; logic circuits; normal circuit description; reconvergent fanout branch pairs; reconvergent sites; test generation; testability analysis; testable design; Automatic testing; Circuit testing; Design for testability; Feeds; Information analysis; Integrated circuit measurements; Logic circuits; Logic testing; Semiconductor device measurement; Very large scale integration; Fanout; Fanout branch; Reconvergence; Testability; Testable Design;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2004. 13th Asian
ISSN
1081-7735
Print_ISBN
0-7695-2235-1
Type
conf
DOI
10.1109/ATS.2004.12
Filename
1376584
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