DocumentCode :
2262603
Title :
Digital Signals in IEEE 1641 and ATML
Author :
Gorringe, Chris ; Brown, Malcolm ; Lopes, Teresa
Author_Institution :
EADS Test Eng. Services (UK) Ltd., Wimborne, UK
fYear :
2009
fDate :
14-17 Sept. 2009
Firstpage :
305
Lastpage :
310
Abstract :
The paper discusses the rational and benefits behind the recent MoD demonstration, using a fully compliant IEEE 1641 test system for both digital and analogue test programs, in line with the MoD ATS procurement policy. This paper considers the support provided by IEEE 1641 to help define digital signals, within an overall signals framework. IEEE 1641 does not look to supplant other digital standards such as IEEE Std. 1445 (DTIF), rather it looks to embrace these within its signal framework, allowing signals to be defined through board simulation or user defined digital signals all within the same standard framework. The paper covers the new IEEE 1641 building blocks and presents a new set of digital TSF components suitable for providing high level abstract digital, which have been used on a digital tester.
Keywords :
automatic test equipment; ATML; IEEE 1641 test system; MoD ATS procurement policy; MoD Automatic Test System; analogue test programs; digital TSF components; digital signals; digital test programs; Automatic test equipment; Automatic testing; Instruments; Open systems; Procurement; Signal processing; Software libraries; System testing; Terminology; USA Councils; Digital Signal; Digital Test; IEEE Std. 1641; Signal Modelling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2009 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
978-1-4244-4980-4
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2009.5314018
Filename :
5314018
Link To Document :
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