Digital Signals in IEEE 1641 and ATML

The paper discusses the rational and benefits behind the recent MoD demonstration, using a fully compliant IEEE 1641 test system for both digital and analogue test programs, in line with the MoD ATS procurement policy. This paper considers the support provided by IEEE 1641 to help define digital signals, within an overall signals framework. IEEE 1641 does not look to supplant other digital standards such as IEEE Std. 1445 (DTIF), rather it looks to embrace these within its signal framework, allowing signals to be defined through board simulation or user defined digital signals all within the same standard framework. The paper covers the new IEEE 1641 building blocks and presents a new set of digital TSF components suitable for providing high level abstract digital, which have been used on a digital tester.