DocumentCode
2262666
Title
High voltage tolerant integrated Buck converter in 65nm 2.5V CMOS
Author
Emira, Ahmed ; Carr, Frank ; Elwan, Hassan ; Mekky, Rania H.
Author_Institution
Newport Media Inc., Cairo, Egypt
fYear
2009
fDate
24-27 May 2009
Firstpage
2405
Lastpage
2408
Abstract
In this paper, an integrated DC-DC (Buck) converter is presented. The Buck converter accepts input voltage in the range 2.7-5.5 V while using 2.5 V devices. A low drop-out (LDO) regulator is used to limit the maximum input voltage to the DCDC switches to protect it against overvoltage breakdown. 5 MHz switching frequency is used to allow using smaller external inductors. The Buck converter is implemented in TSMC 65 nm CMOS technology and it occupies 0.15 mm2 while the LDO regulator, bandgap, clock generator and bias circuits occupy 0.19 mm2. Up to 88% and 77% efficiency is achieved at 2.5 V and 1.2 V output, respectively, using 3.6 V input. If the input voltage is limited to 3.3 V, the LDO regulator is bypassed, and the peak efficiency becomes 92% for 2.5 V and 85% for 1.2 V output.
Keywords
CMOS integrated circuits; DC-DC power convertors; switching convertors; DCDC switches; LDO regulator; TSMC CMOS technology; bias circuits; clock generator; external inductor; frequency 5 MHz; high voltage tolerant integrated DC-DC buck converter; low drop-out regulator; overvoltage breakdown protection; size 65 nm; switching frequency; voltage 1.2 V; voltage 2.5 V; voltage 2.7 V to 5.5 V; Breakdown voltage; Buck converters; CMOS technology; DC-DC power converters; Inductors; Protection; Regulators; Switches; Switching frequency; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
Conference_Location
Taipei
Print_ISBN
978-1-4244-3827-3
Electronic_ISBN
978-1-4244-3828-0
Type
conf
DOI
10.1109/ISCAS.2009.5118285
Filename
5118285
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