DocumentCode :
2262666
Title :
High voltage tolerant integrated Buck converter in 65nm 2.5V CMOS
Author :
Emira, Ahmed ; Carr, Frank ; Elwan, Hassan ; Mekky, Rania H.
Author_Institution :
Newport Media Inc., Cairo, Egypt
fYear :
2009
fDate :
24-27 May 2009
Firstpage :
2405
Lastpage :
2408
Abstract :
In this paper, an integrated DC-DC (Buck) converter is presented. The Buck converter accepts input voltage in the range 2.7-5.5 V while using 2.5 V devices. A low drop-out (LDO) regulator is used to limit the maximum input voltage to the DCDC switches to protect it against overvoltage breakdown. 5 MHz switching frequency is used to allow using smaller external inductors. The Buck converter is implemented in TSMC 65 nm CMOS technology and it occupies 0.15 mm2 while the LDO regulator, bandgap, clock generator and bias circuits occupy 0.19 mm2. Up to 88% and 77% efficiency is achieved at 2.5 V and 1.2 V output, respectively, using 3.6 V input. If the input voltage is limited to 3.3 V, the LDO regulator is bypassed, and the peak efficiency becomes 92% for 2.5 V and 85% for 1.2 V output.
Keywords :
CMOS integrated circuits; DC-DC power convertors; switching convertors; DCDC switches; LDO regulator; TSMC CMOS technology; bias circuits; clock generator; external inductor; frequency 5 MHz; high voltage tolerant integrated DC-DC buck converter; low drop-out regulator; overvoltage breakdown protection; size 65 nm; switching frequency; voltage 1.2 V; voltage 2.5 V; voltage 2.7 V to 5.5 V; Breakdown voltage; Buck converters; CMOS technology; DC-DC power converters; Inductors; Protection; Regulators; Switches; Switching frequency; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3827-3
Electronic_ISBN :
978-1-4244-3828-0
Type :
conf
DOI :
10.1109/ISCAS.2009.5118285
Filename :
5118285
Link To Document :
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