• DocumentCode
    2262671
  • Title

    Considering fault dependency and debugging time lag in reliability growth modeling during software testing

  • Author

    Huang, Chin-Yu ; Lin, Chu-Ti ; Sue, Chuan-Ching

  • Author_Institution
    Dept. of Comput. Sci., National TsingHua Univ., Hsinchu, Taiwan
  • fYear
    2004
  • fDate
    15-17 Nov. 2004
  • Firstpage
    378
  • Lastpage
    383
  • Abstract
    Since the early 1970s tremendous growth has been seen in the research of software reliability growth modeling. In general, software reliability growth models (SRGMs) are applicable to the late stages of testing in software development and they can provide useful information about how to improve the reliability of software products. For most existing SRGMs, most researchers assume that faults are immediately detected and corrected. However, in practice, this assumption may not be realistic and satisfied. In this paper we first give a review of fault detection and correction processes in SRGMs. We show how several existing SRGMs based on NHPP models can be comprehensively derived by applying the time-dependent delay function. Furthermore, we show how to incorporate both failure dependency and time-dependent delay function into software reliability growth modeling. We present stochastic reliability models for software failure phenomenon based on NHPPs. Some numerical examples based on real software failure data sets are presented. The results show that the proposed framework to incorporate both failure dependency and time-dependent delay function into software reliability modeling has a useful interpretation in testing and correcting the software.
  • Keywords
    program debugging; program testing; software reliability; NHPP models; fault correction; fault dependency; fault detection; software development; software failure data sets; software failure phenomenon; software reliability growth modeling; software testing; stochastic reliability models; time lag debugging; time-dependent delay function; Computer science; Debugging; Delay effects; Fault detection; Programming; Reliability engineering; Software reliability; Software systems; Software testing; Stochastic processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2004. 13th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2235-1
  • Type

    conf

  • DOI
    10.1109/ATS.2004.33
  • Filename
    1376588