• DocumentCode
    2262702
  • Title

    IEEE Std 1641

  • Author

    Gorringe, Chris

  • Author_Institution
    EADS Test Eng. Services (UK) Ltd., Wimborne, UK
  • fYear
    2009
  • fDate
    14-17 Sept. 2009
  • Firstpage
    241
  • Lastpage
    245
  • Abstract
    Over the past three years, the IEEE Std 1641 Signal & Test Definition standard has been evolving and maturing. This year its first revision is set to come out. This paper discusses the changes and improvements incorporated within the revised draft standard and identifies how this standard has been integrated into other test standards, such as ATML. In most cases, the revised standard clarifies existing practices and removes inherent ambiguity. The new revision is now based far more on its XML pedigree, deferring its original ATLAS roots, whilst still supporting those legacy signals. The revised standard has also introduced some new components to better support digital and protocol testing. These new components bridge the gap between analogue and event signals, something that the original standard supported but did not provide any detail on. The revised standard now provides a comprehensive set of building blocks supporting analogue, events, and digital signals.
  • Keywords
    IEEE standards; automatic testing; IEEE Std 1641; XML; analogue signals; digital signals; event signals; revised standard; signal & test definition standard; Area measurement; Bridges; Hardware; Impedance measurement; Logic gates; Monitoring; Protocols; Signal processing; Testing; XML; ATE; ATS; IEEE Std 1641; signal modeling; test definitions; test requirements; test signals;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2009 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-4980-4
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2009.5314021
  • Filename
    5314021