DocumentCode
2262702
Title
IEEE Std 1641
Author
Gorringe, Chris
Author_Institution
EADS Test Eng. Services (UK) Ltd., Wimborne, UK
fYear
2009
fDate
14-17 Sept. 2009
Firstpage
241
Lastpage
245
Abstract
Over the past three years, the IEEE Std 1641 Signal & Test Definition standard has been evolving and maturing. This year its first revision is set to come out. This paper discusses the changes and improvements incorporated within the revised draft standard and identifies how this standard has been integrated into other test standards, such as ATML. In most cases, the revised standard clarifies existing practices and removes inherent ambiguity. The new revision is now based far more on its XML pedigree, deferring its original ATLAS roots, whilst still supporting those legacy signals. The revised standard has also introduced some new components to better support digital and protocol testing. These new components bridge the gap between analogue and event signals, something that the original standard supported but did not provide any detail on. The revised standard now provides a comprehensive set of building blocks supporting analogue, events, and digital signals.
Keywords
IEEE standards; automatic testing; IEEE Std 1641; XML; analogue signals; digital signals; event signals; revised standard; signal & test definition standard; Area measurement; Bridges; Hardware; Impedance measurement; Logic gates; Monitoring; Protocols; Signal processing; Testing; XML; ATE; ATS; IEEE Std 1641; signal modeling; test definitions; test requirements; test signals;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2009 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
978-1-4244-4980-4
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2009.5314021
Filename
5314021
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