DocumentCode :
2262770
Title :
Optimization of test engineering utilizing evolutionary computation
Author :
Engler, Joseph
Author_Institution :
Rockwell Collins Inc., Cedar Rapids, IA, USA
fYear :
2009
fDate :
14-17 Sept. 2009
Firstpage :
447
Lastpage :
452
Abstract :
Test engineering often experiences pressures to produce test stations and software in a short time frame with constrained budgets. Since test is a negative influence towards product costs, it is crucial to optimize the processes of test station software creation as well as the configuration of the test station itself. This paper introduces novel methodologies for optimized station configuration and automated station software generation. These two optimizations utilize evolutionary computation to automatically generate software for the test station and to offer optimal configurations of the station based upon testing requirements. Presented is a modified genetic programming algorithm for the creation of test station software (e.g. COTS software drivers). The genetic algorithm is improved through use of adaptive memory to recall historic schemas of high fitness. From the automated software generation an optimal station configuration is produced based upon the requirements of the testing to be performed. This system has been implemented in industry and an actual industrial case study is presented to illustrate the efficiency of this novel optimization technique. Comparisons with standard genetic programming techniques are offered to further illustrate the efficiency of this methodology.
Keywords :
automatic test pattern generation; automatic test software; genetic algorithms; adaptive memory; automated station software generation; evolutionary computation; genetic programming algorithm; test engineering optimization; test station software creation; testing requirements; Automatic testing; Cost function; Evolutionary computation; Genetic algorithms; Genetic programming; Optimization methods; Software algorithms; Software performance; Software testing; Time factors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2009 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
978-1-4244-4980-4
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2009.5314025
Filename :
5314025
Link To Document :
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