DocumentCode :
2262828
Title :
The effect of temporal pulse shaping in ultrafast laser ablation of dielectrics
Author :
Stoian, R. ; Boyle, M. ; Thoss, A. ; Rosenfeld, A. ; Korn, G. ; Hertel, I.V.
Author_Institution :
Max-Born-Inst. fur Nichtlineare Opt. und Kurzzeitspektroskopie, Berlin, Germany
fYear :
2002
fDate :
24-24 May 2002
Firstpage :
126
Abstract :
Summary from only given. Femtosecond laser ablation of dielectrics, especially of brittle materials, often results in specific collateral damage in the form of fracture and exfoliation, as a consequence of the mechanical stress induced in the material. Fast electronic relaxation in solids with strong electron-phonon coupling establishes a guideline for using temporally-shaped pulses to exploit dynamical processes and optimize structuring with respect to the reduction of the residual damage. First effects of a modulated excitation were extracted by studying laser-induced optical damage with temporally tailored pulses. Two extreme cases were considered; /spl alpha/-SiO/sub 2/ with 100 fs electron trapping in self-induced deformations and Al/sub 2/O/sub 3/ where electrons remain quasi-free for tens of ps.
Keywords :
deformation; electron-phonon interactions; high-speed optical techniques; laser ablation; /spl alpha/-SiO/sub 2/; Al/sub 2/O/sub 3/; SiO/sub 2/; brittle materials; collateral damage; dielectrics; femtosecond laser ablation; laser-induced optical damage; modulated excitation; residual damage; self-induced deformations; solids; strong electron-phonon coupling; temporally tailored pulses; temporally-shaped pulses; Dielectric materials; Electrons; Laser ablation; Optical materials; Optical pulses; Pulse modulation; Pulse shaping methods; Stress; Ultrafast electronics; Ultrafast optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
Type :
conf
DOI :
10.1109/CLEO.2002.1033514
Filename :
1033514
Link To Document :
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