DocumentCode
2262829
Title
Automation of measurements of semiconductor device parameters in LabVIEW environment
Author
Borisov, A.V. ; Borisova, Olga I.
Author_Institution
Siberian State Univ. of Telecommun. & Informatics, Novosibirsk, Russia
fYear
2005
fDate
1-5 July 2005
Firstpage
55
Lastpage
56
Abstract
The application of single-chip ADuC microcomputers together with LabVIEW package allow to develop cheap multi-functional automated measuring systems, necessary for development of modern radio electronic equipment. In this paper some measuring device development techniques are considered.
Keywords
computerised instrumentation; electronic engineering computing; microcomputer applications; semiconductor device measurement; semiconductor device testing; LabVIEW package; measurement automation; multifunctional automated measuring systems; semiconductor device parameters; single-chip ADuC microcomputers; Automation; Current measurement; Electronic equipment; Frequency measurement; Informatics; Microcomputers; P-i-n diodes; Packaging; Semiconductor device measurement; Semiconductor devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Materials, 2005. Proceedings. 6th Annual. 2005 International Siberian Workshop and Tutorials on
ISSN
1815-3712
Print_ISBN
5-7782-0491-4
Type
conf
DOI
10.1109/SIBEDM.2005.195584
Filename
1523189
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