• DocumentCode
    2262873
  • Title

    Modeling and simulation for crosstalk aggravated by weak-bridge defects between on-chip interconnects

  • Author

    Wang, Lei ; Gupta, Sandeep K. ; Breuer, Melvin A.

  • Author_Institution
    Dept. of EE Syst., Southern California Univ., Los Angeles, CA, USA
  • fYear
    2004
  • fDate
    15-17 Nov. 2004
  • Firstpage
    440
  • Lastpage
    447
  • Abstract
    This paper presents comprehensive analytic models that consider both the case of a weak bridge, and the combination of a weak bridge and crosstalk between two interconnects. Our models capture the induced signal delay and pulse as a function of the parameters of the circuit and input signals. Our results are compared with HSPICE and shown to be accurate. A simulator is developed that implements our models and accurately captures timing (delay) characteristics of a circuit. We contrast our results with others, and show the benefits of this new model as well as the ability to predict the range of resistance that leads to delay errors.
  • Keywords
    SPICE; bridge circuits; circuit analysis computing; crosstalk; delay circuits; delays; integrated circuit design; integrated circuit interconnections; timing; HSPICE; crosstalk modeling; crosstalk simulation; delay characteristics; delay errors; induced signal delay; on-chip interconnects; timing characteristics; weak-bridge defects; Bridge circuits; Capacitance; Circuit faults; Circuit testing; Coupling circuits; Crosstalk; Delay effects; Integrated circuit interconnections; Logic; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2004. 13th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2235-1
  • Type

    conf

  • DOI
    10.1109/ATS.2004.58
  • Filename
    1376597