DocumentCode
2262873
Title
Modeling and simulation for crosstalk aggravated by weak-bridge defects between on-chip interconnects
Author
Wang, Lei ; Gupta, Sandeep K. ; Breuer, Melvin A.
Author_Institution
Dept. of EE Syst., Southern California Univ., Los Angeles, CA, USA
fYear
2004
fDate
15-17 Nov. 2004
Firstpage
440
Lastpage
447
Abstract
This paper presents comprehensive analytic models that consider both the case of a weak bridge, and the combination of a weak bridge and crosstalk between two interconnects. Our models capture the induced signal delay and pulse as a function of the parameters of the circuit and input signals. Our results are compared with HSPICE and shown to be accurate. A simulator is developed that implements our models and accurately captures timing (delay) characteristics of a circuit. We contrast our results with others, and show the benefits of this new model as well as the ability to predict the range of resistance that leads to delay errors.
Keywords
SPICE; bridge circuits; circuit analysis computing; crosstalk; delay circuits; delays; integrated circuit design; integrated circuit interconnections; timing; HSPICE; crosstalk modeling; crosstalk simulation; delay characteristics; delay errors; induced signal delay; on-chip interconnects; timing characteristics; weak-bridge defects; Bridge circuits; Capacitance; Circuit faults; Circuit testing; Coupling circuits; Crosstalk; Delay effects; Integrated circuit interconnections; Logic; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2004. 13th Asian
ISSN
1081-7735
Print_ISBN
0-7695-2235-1
Type
conf
DOI
10.1109/ATS.2004.58
Filename
1376597
Link To Document