• DocumentCode
    2263096
  • Title

    A probabilistic approach to camera pose and calibration from a small set of point and line correspondences

  • Author

    Chaperon, Thomas ; Droulez, Jacques ; Thibault, Guillaume

  • Author_Institution
    Trimble 3D Scanning, Fontenay-sous-Bois, France
  • fYear
    2009
  • fDate
    Sept. 27 2009-Oct. 4 2009
  • Firstpage
    1678
  • Lastpage
    1685
  • Abstract
    We present a new method for solving the problem of camera pose and calibration from a limited number of correspondences between noisy 2D and 3D features. We show that the probabilistic estimation problem can be expressed as a partially linear problem, where point and line correspondences are mixed using a common formulation. Our Sampling-Solving algorithm enables to robustly estimate the parameters and evaluate the probability distribution of the estimated parameters. It solves the problem of pose estimation with unknown focal length using a minimum of only four correspondences (five if the principal point is also unknown). To our knowledge, this is the first calibration method using so few correspondences of both points and lines. Experimental results show that the algorithm is very robust to Gaussian noise, even for minimal data sets. Finally, some tests show the potential of global uncertainty estimates on real data sets.
  • Keywords
    Gaussian noise; calibration; cameras; image sampling; pose estimation; probability; uncertain systems; Gaussian noise; calibration; camera pose; focal length; global uncertainty estimation; pose estimation; probabilistic approach; probabilistic estimation problem; sampling-solving algorithm; Calibration; Cameras; Conferences; Cost function; Laser modes; Laser noise; Noise reduction; Noise robustness; Parameter estimation; Research and development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision Workshops (ICCV Workshops), 2009 IEEE 12th International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4244-4442-7
  • Electronic_ISBN
    978-1-4244-4441-0
  • Type

    conf

  • DOI
    10.1109/ICCVW.2009.5457485
  • Filename
    5457485