Title :
A TPS Integrated Development Environment implementing IEEE1641 and ATML
Author :
Liyan, Qiao ; Zhaoqing Liu ; Yu, Peng ; Xiyuan, Peng
Author_Institution :
Dept. of Autom. Test & Control, Harbin Inst. of Technol., Harbin, China
Abstract :
With the publication of IEEE1641 and Automatic Test Markup Language (ATML), high level solutions to instrument interchange problem can be accomplished in the near future. This paper introduced a TPS (Test Program Set) Integrated Development Environment (IDE), including a Graphical Signal and Test definition application and an ATML Executive Environment. Experiment shows the TPS IDE can reduce development time and maintenance of test system.
Keywords :
IEEE standards; automatic testing; page description languages; ATML; Automatic Test Markup Language; IEEE 1641; Integrated Development Environment; graphical signal and test definition; instrument interchange problem; test program set; Automatic testing; Costs; Instruments; Markup languages; Signal generators; Signal mapping; Software testing; Standards development; System testing; XML; 1641; ATML; IDE; signal oriented;
Conference_Titel :
AUTOTESTCON, 2009 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-4980-4
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2009.5314048
