DocumentCode
2263267
Title
A TPS Integrated Development Environment implementing IEEE1641 and ATML
Author
Liyan, Qiao ; Zhaoqing Liu ; Yu, Peng ; Xiyuan, Peng
Author_Institution
Dept. of Autom. Test & Control, Harbin Inst. of Technol., Harbin, China
fYear
2009
fDate
14-17 Sept. 2009
Firstpage
246
Lastpage
250
Abstract
With the publication of IEEE1641 and Automatic Test Markup Language (ATML), high level solutions to instrument interchange problem can be accomplished in the near future. This paper introduced a TPS (Test Program Set) Integrated Development Environment (IDE), including a Graphical Signal and Test definition application and an ATML Executive Environment. Experiment shows the TPS IDE can reduce development time and maintenance of test system.
Keywords
IEEE standards; automatic testing; page description languages; ATML; Automatic Test Markup Language; IEEE 1641; Integrated Development Environment; graphical signal and test definition; instrument interchange problem; test program set; Automatic testing; Costs; Instruments; Markup languages; Signal generators; Signal mapping; Software testing; Standards development; System testing; XML; 1641; ATML; IDE; signal oriented;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2009 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
978-1-4244-4980-4
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2009.5314048
Filename
5314048
Link To Document