• DocumentCode
    2263323
  • Title

    A Flexible and Cost-Effective File-Wise Reliability Scheme for Storage Systems

  • Author

    Tseng, Tzer-Ta ; Hsu, YarSun

  • Author_Institution
    Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    1-3 Sept. 2010
  • Firstpage
    427
  • Lastpage
    433
  • Abstract
    This work presents a new scheme of reliability mechanism in storage systems. The new scheme defines reliability and protects data in the scope of file, which is very different from traditional strategies, which protect data in the scopes of storage block or the whole device. The scheme provides the possibility to store highly reliable files and normal ones under the same file system, increasing flexibilities and decreasing costs of storage systems. To implement this scheme, Linux virtual file system (VFS) layer has been modified to perform reliability related operations during I/O calling paths and provide new interfaces for file systems to define their own reliability methods. A modified Ext2 file system with different levels of reliability has also been built as an example design of the new scheme. Depending on reliability levels, files in the example design are protected by parity check and Reed-Solomon Code of different code rates, which incur different overheads.
  • Keywords
    Reed-Solomon codes; data structures; fault tolerance; parity check codes; security of data; virtual storage; Ext2 file system; I/O calling path; Linux virtual file system layer; Reed-Solomon code; data protection; file-wise reliability scheme; parity check; storage block; storage system; Fault-tolerance; File System; Linux; Redundant Arrays of Inexpensive Disks (RAID); Reliability; Virtual File System (VFS);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Computing and Communications (HPCC), 2010 12th IEEE International Conference on
  • Conference_Location
    Melbourne, VIC
  • Print_ISBN
    978-1-4244-8335-8
  • Electronic_ISBN
    978-0-7695-4214-0
  • Type

    conf

  • DOI
    10.1109/HPCC.2010.28
  • Filename
    5581480