Title :
Interaction-based quantum metrology giving a scaling beyond the Heisenberg limit
Author :
Napolitano, M. ; Koschorreck, M. ; Dubost, B. ; Behbood, N. ; Sewell, R.J. ; Mitchell, M.W.
Author_Institution :
ICFO-lnstitut de Cienc. Fotoniques, Barcelona, Spain
Abstract :
Atom-mediated optical nonlinearities, generated within an atom-light quantum interface, allow spin measurement with sensitivity that scales better than the Heisenberg limit. This demonstrates interactions as a new resource for quantum metrology.
Keywords :
atom optics; nonlinear optics; quantum entanglement; quantum optics; Heisenberg limit; allow spin measurement; atom-light quantum interface; atom-mediated optical nonlinearities; interaction-based quantum metrology; Atom optics; Atomic measurements; Metrology; Optical pumping; Optical sensors; Probes; Sensitivity;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
