• DocumentCode
    2263407
  • Title

    Evaluating one-hot encoding finite state machines for SEU reliability in SRAM-based FPGAs

  • Author

    Cassel, Maico ; Lima, Fausto

  • Author_Institution
    Inst. de Informatica, UFRGS, Porto Alegre
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    This work discusses the use of two fault-tolerant techniques, duplication with self-checking and triple modular redundancy, for one-hot encoding FSM in SRAM-based techniques. The FSM encoding styles have a significant influence on the dependability of the machine in presence of bit-flips, known as single event upsets (SEUs). Although the one-hot encoding style presents the best trade-off in terms of reliability, modern synthesis tools tend to optimize crucial characteristic of the one-hot style. Consequently, techniques must be applied in the hardware description language to ensure reliability of protected one-hot FSM. Results present in this paper show that fault-tolerant techniques can be easily optimized by the tools reducing the robustness of the final design. Solutions in the RTL level are proposed to ensure reliability
  • Keywords
    SRAM chips; circuit reliability; encoding; fault tolerance; field programmable gate arrays; finite state machines; FPGA; SEU reliability; SRAM; duplication with self-checking; fault tolerant techniques; finite state machines; one hot encoding; single event upsets; triple modular redundancy; Automata; Design optimization; Encoding; Fault tolerance; Field programmable gate arrays; Hardware design languages; Protection; Redundancy; Robustness; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International
  • Conference_Location
    Lake Como
  • Print_ISBN
    0-7695-2620-9
  • Type

    conf

  • DOI
    10.1109/IOLTS.2006.32
  • Filename
    1655533