Title :
Emulation-based fault injection in circuits with embedded memories
Author :
García-Valderas, Mario ; Portela-García, Marta ; López-Ongil, Celia ; Entrena, Luis
Author_Institution :
Dept. of Electron. Technol., Carlos III Univ. of Madrid
Abstract :
FPGA emulation has proven to be a performance effective method to analyse the behaviour of digital circuits in the presence of soft errors due to SEU effects. In particular, the recently developed autonomous emulation techniques allow the classification of thousands and even millions of faults per second. In this paper, an approach to extend the autonomous emulation techniques to circuits with embedded memories is presented. The LEON2 processor benchmark is used to demonstrate as an application for the proposed techniques
Keywords :
digital storage; fault simulation; field programmable gate arrays; microcomputers; microprocessor chips; FPGA emulation; LEON2 processor benchmark; SEU effect; digital circuit behaviour; embedded memory circuit; emulation-based fault injection; soft errors; Circuit faults; Controllability; Costs; Emulation; Field programmable gate arrays; Flip-flops; Instruments; Microelectronics; Observability; Performance analysis;
Conference_Titel :
On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International
Conference_Location :
Lake Como
Print_ISBN :
0-7695-2620-9
DOI :
10.1109/IOLTS.2006.29
