Title :
Broadband electrical permittivity of gold for plasmonics and nano-optics applications
Author :
Boreman, Glenn D. ; Johnson, Timothy ; Jones, Andrew C. ; Oh, Sang-Hyun ; Olmon, Robert L. ; Raschke, Markus B. ; Shelton, David ; Slovick, Brian
Author_Institution :
Center for Res. & Educ. in Opt. & Lasers (CREOL), Univ. of Central Florida, Orlando, FL, USA
Abstract :
We measure the electrical permittivity of different bulk and film gold samples by spectroscopic ellipsometry from 200 nm to 20 μm, resolving inconsistencies on plasmon resonances, lifetime, and SPP propagation associated with imprecise current literature values.
Keywords :
ellipsometry; gold; nanophotonics; permittivity; permittivity measurement; plasmonics; surface plasmon resonance; SPP propagation; broadband electrical permittivity; gold; nanooptics applications; plasmon resonances; plasmonics; spectroscopic ellipsometry; Gold; Optical surface waves; Permittivity; Permittivity measurement; Plasmons; Rough surfaces; Surface roughness;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
