DocumentCode
2263693
Title
[Front cover]
fYear
2009
fDate
14-17 Sept. 2009
Abstract
The following topics are dealt with: net-centric solutions; test program set design & rehost; ATE instrumentation; ATML applications; software applications; prognostics & health monitoring; cost-effective solutions; digital applications; hardware/software solutions; design for testability; IEEE 1641; DoD ATS framework; diagnostics method; synthetic instruments and test asset optimization.
Keywords
IEEE standards; automatic test pattern generation; computerised instrumentation; condition monitoring; design for testability; fault diagnosis; military systems; ATML applications; DoD ATS framework; IEEE 1641; design-for-testability; hardware-software solution; health monitoring; net-centric solution; synthetic instruments; test asset optimization; test program set design;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2009 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
978-1-4244-4980-4
Type
conf
DOI
10.1109/AUTEST.2009.5314068
Filename
5314068
Link To Document