DocumentCode :
2263759
Title :
Should Logic SER be Solved at the Circuit Level?
Author :
Mak, T.M. ; Mitra, S.
Author_Institution :
Intel Corporation
fYear :
2006
fDate :
10-12 July 2006
Firstpage :
199
Lastpage :
199
Abstract :
SER is one of the problems associated with continued scaling. Traditionally, logic SER is solved at the system/architecture level (e.g., DMR, TMR, checkpointing/recovery). There has also been some work at the process level (e.g., SOI), but recently, there is also some research work on circuit level (e.g., cell hardening, BISER), but there has not been a wide spread adoption yet. Can logic SER be solved at the circuit level? Should they be? We have a team of experts from system, architecture and circuit area to debate this topic.
Keywords :
Checkpointing; Circuit testing; Logic circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International
Print_ISBN :
0-7695-2620-9
Type :
conf
DOI :
10.1109/IOLTS.2006.56
Filename :
1655549
Link To Document :
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