DocumentCode :
2263851
Title :
Technical program chair message
Author :
Ellis, Mike
fYear :
2009
fDate :
14-17 Sept. 2009
Abstract :
Welcome to IEEE AUTOTESTCON 2009 and the promise of yet-another great conference. As trade shows across-the-board react to the economic downturn with reduced exhibits and attendees, or even show cancellations, your Board continues to be amazed at both the success and the resilience of AUTOTESTCON. This will be the last show in Anaheim, and for many of us we will miss the atmosphere and cheerful great service we have received from Mickey´s Cast Members over the years. The 2012 change in West Coast venue is driven however not by the downturn in the economy, but by the up-tick in conference needs. Simply put, we have outgrown the facilities!
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2009 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
978-1-4244-4980-4
Type :
conf
DOI :
10.1109/AUTEST.2009.5314078
Filename :
5314078
Link To Document :
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