Using Deep Serial Memory for large block data transfers

This paper will explain some of the advantages of utilizing an instrument with Deep Serial Memory in digital test applications that involve large block data transfer. Deep Serial Memory can accommodate test applications that use large block transfers of data, such as read-only memory (ROM) testing, boundary scan and communications that involve read/write of megawords of data. Conventional test pattern memory can be exhausted by these applications. A test case will be presented to simplify the creation and support of tests for a Read Only Memory (ROM). The techniques applied in this example show how the transfer of large blocks of data can be easier and more practical with Deep Serial Memory.