Title :
Influence of the oscillation frequency value on the efficiency of oscillation-based tests
Author :
Arbet, D. ; Stopjakova, V.
Author_Institution :
Inst. of Electron. & Photonics, Slovak Univ. of Technol., Bratislava, Slovakia
Abstract :
The main goal of this paper is investigation of the fault coverage dependence on the value of the oscillation frequency in oscillation-based tests of analog circuits. For this purpose, an operational amplifier designed in 90 nm CMOS technology was used as a Circuit Under Test (CUT) in our experiment. Then, the CUT was transformed into an oscillator and different catastrophic faults were considered. The achieved experimental results show that selection of the appropriate value of the oscillation frequency might considerable increase the detectability of selected hard-detectable faults.
Keywords :
CMOS analogue integrated circuits; integrated circuit testing; operational amplifiers; CMOS technology; CUT; analog circuits; catastrophic faults; circuit under test; hard-detectable faults; operational amplifier; oscillation frequency value; oscillation-based tests; size 90 nm; Analog circuits; CMOS integrated circuits; CMOS technology; Circuit faults; Electronic circuits; Oscillators; Resistance;
Conference_Titel :
Applied Electronics (AE), 2014 International Conference on
Conference_Location :
Pilsen
Print_ISBN :
978-8-0261-0276-2
DOI :
10.1109/AE.2014.7011657
