• DocumentCode
    2263942
  • Title

    Test program set (TPS) migration

  • Author

    Peet, Robert

  • Author_Institution
    SEICA Inc., Salem, NH, USA
  • fYear
    2009
  • fDate
    14-17 Sept. 2009
  • Firstpage
    29
  • Lastpage
    33
  • Abstract
    TPS migration solutions address the problem of legacy ATE systems, which support the validation of military/aerospace systems, experiencing "end of life" issues. A cross section of ATE systems will be reviewed from both a hardware and software perspective, with specific emphasis on the challenges and solutions on TPS\´s using LASARtrade simulation. Solutions will be presented on how to migrate the existing test program sets to current technology at considerably reduced time and cost. These TPS software migration tools allow for the easy conversion and migration of functional test programs, with minimal debug to a new state-of-the-art test system. By retaining features, such as guided probe, fault dictionary, and many others, test programs developed in the 70\´s to the current 90\´s are easily ported and therefore supported for many more years to come. Special attention will also be given to discussing enhancements to legacy programs after migration with new software tools. The tools available today, combined with hardware advances can show improved test coverage and diagnostic capabilities over the original TPS on the legacy system. Legacy test platforms include: GenRad, Teradyne, Computer Automation, Schlumberger, Factron and others.
  • Keywords
    automatic test equipment; automatic test software; program debugging; software maintenance; Computer Automation; Factron; GenRad; LASAR simulation; Schlumberger; TPS software migration tools; Teradyne; aerospace systems; functional test programs; legacy programs; military systems; test program set migration; Aerospace testing; Automatic testing; Costs; Dictionaries; Hardware; Probes; Software debugging; Software testing; Software tools; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2009 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-4980-4
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2009.5314083
  • Filename
    5314083