Title : 
Checker no-harm alarm robustness
         
        
            Author : 
Rossi, Daniele ; Omana, Martin ; Metra, Cecilia ; Pagni, Andrea
         
        
            Author_Institution : 
D.E.I.S., Bologna Univ.
         
        
        
        
        
            Abstract : 
In this paper we evaluate the probability that a transient fault (TF), multiple or single, affecting a checker of a self-checking circuit, gives rise to an unnecessary error indication (no-harm alarm). A new property (no-harm alarm robustness) has been defined that, in case of a fault affecting a self-checking circuit (SCC), guarantees that we can determine whether the fault is affecting the functional block, or the checker itself, and whether such a fault is a transient or a permanent fault. Finally, we propose a possible solution implementing the defined property. Its behavior has been verified by means of HSpice simulations, and we evaluate its cost in terms of area overhead and introduced delay
         
        
            Keywords : 
SPICE; built-in self test; error statistics; fault simulation; integrated circuit testing; HSpice simulations; SCC; TF; area overhead; checker; fault effect; functional block; no-harm alarm robustness; permanent fault; probability evaluation; self-checking circuit; transient fault; unnecessary error indication; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Costs; Delay; Error correction; Microelectronics; Robustness; Sea level;
         
        
        
        
            Conference_Titel : 
On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International
         
        
            Conference_Location : 
Lake Como
         
        
            Print_ISBN : 
0-7695-2620-9
         
        
        
            DOI : 
10.1109/IOLTS.2006.16