DocumentCode
2264020
Title
How to mitigate hardware obsolescence in next-generation test systems
Author
Tacha, Nathan ; McCarthy, Alex ; Powell, Brian ; Veeramani, Arun
Author_Institution
Nat. Instrum. Corp., Austin, TX, USA
fYear
2009
fDate
14-17 Sept. 2009
Firstpage
229
Lastpage
234
Abstract
Automatic test engineers are faced with replacing obsolete software and hardware in systems that remain in operation longer than individual components are supported. Replacing obsolete hardware can be especially challenging because of the need to modify test software in order to support new instrumentation. Changes to test software in order to support new instrumentation might affect multiple areas of the application and require time-consuming development or costly revalidation. This paper explains how you can mitigate hardware obsolescence with the use of well-designed hardware abstraction layers.
Keywords
program testing; automatic test engineer; hardware abstraction layer; hardware obsolescence; next-generation test system; software testing; time-consuming development; Application software; Automatic testing; Costs; Hardware; Instruments; Life testing; Logic testing; Object oriented modeling; Software testing; System testing; life-cycle mismatch; migration; object-oriented programming; obsolescence; re-hosting; user-defined;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2009 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
978-1-4244-4980-4
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2009.5314087
Filename
5314087
Link To Document