• DocumentCode
    2264020
  • Title

    How to mitigate hardware obsolescence in next-generation test systems

  • Author

    Tacha, Nathan ; McCarthy, Alex ; Powell, Brian ; Veeramani, Arun

  • Author_Institution
    Nat. Instrum. Corp., Austin, TX, USA
  • fYear
    2009
  • fDate
    14-17 Sept. 2009
  • Firstpage
    229
  • Lastpage
    234
  • Abstract
    Automatic test engineers are faced with replacing obsolete software and hardware in systems that remain in operation longer than individual components are supported. Replacing obsolete hardware can be especially challenging because of the need to modify test software in order to support new instrumentation. Changes to test software in order to support new instrumentation might affect multiple areas of the application and require time-consuming development or costly revalidation. This paper explains how you can mitigate hardware obsolescence with the use of well-designed hardware abstraction layers.
  • Keywords
    program testing; automatic test engineer; hardware abstraction layer; hardware obsolescence; next-generation test system; software testing; time-consuming development; Application software; Automatic testing; Costs; Hardware; Instruments; Life testing; Logic testing; Object oriented modeling; Software testing; System testing; life-cycle mismatch; migration; object-oriented programming; obsolescence; re-hosting; user-defined;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2009 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-4980-4
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2009.5314087
  • Filename
    5314087