DocumentCode :
2264387
Title :
Wavelet analysis approach to identification of systems with dead time application to boiler process
Author :
Nakano, Kazushi ; Tabaru, Tetsuya ; Shin, Seiichi ; Satou, Mizuhiro
Author_Institution :
Dept. of Electr. Eng., Fukuoka Inst. of Technol., Japan
Volume :
4
fYear :
1997
fDate :
10-12 Dec 1997
Firstpage :
3375
Abstract :
The wavelet analysis is superior to the Fourier analysis in the detectability of temporal (or spatial) information of signals. Therefore, the use of this time-frequency analysis approach makes it possible to estimate such singular points as dead time, and the use of the analyzing wavelet which exists locally in the frequency domain makes it possible to estimate the frequency response of the transfer function. First, we present a dead time identification technique by using the wavelet transform of the cross-spectra of input/output (I/O) data. Secondly, we present a method for obtaining the frequency response of the system to be considered by directly using the wavelet transform of the auto-/cross-correlation functions of the I/O data. Thirdly, we determine the parameters in the transfer function by using the curve fitting in the least squares sense. Finally, we demonstrate the feasibility and validity of our identification procedure through experiments for an actual boiler process
Keywords :
boilers; closed loop systems; curve fitting; frequency response; identification; least squares approximations; time-frequency analysis; transfer functions; wavelet transforms; cross-spectra; curve fitting; dead time estimation; detectability; frequency response; spatial information; temporal information; time-frequency analysis; transfer function; wavelet analysis; Frequency domain analysis; Frequency estimation; Frequency response; Information analysis; Signal analysis; Time frequency analysis; Transfer functions; Wavelet analysis; Wavelet domain; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control, 1997., Proceedings of the 36th IEEE Conference on
Conference_Location :
San Diego, CA
ISSN :
0191-2216
Print_ISBN :
0-7803-4187-2
Type :
conf
DOI :
10.1109/CDC.1997.652368
Filename :
652368
Link To Document :
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