DocumentCode :
2264774
Title :
Batched and cascaded run rate validation in a multi-module toolset
Author :
Daly, K.
Author_Institution :
Leixlip Co., Intel Ireland Ltd., Kildare, Ireland
fYear :
2003
fDate :
30 Sept.-2 Oct. 2003
Firstpage :
111
Lastpage :
114
Abstract :
As the run rate of a multi-module toolset can depend on many dynamic factors such as the product/layer mix, cascade level, and batch size, it is very difficult to predict the actual run rates that will be achieved in practice. Thus, validation of these is critical to accurate capacity planning. This paper discusses a robust and straightforward process, and presentation format, that delivers an unambiguous statement of the run rate performance for multi-module toolsets. At Intel Ireland, this process has significantly improved the accuracy of the tool capacity calculations and has reduced the validation time by over 90%.
Keywords :
capacity planning (manufacturing); integrated circuit manufacture; lithography; modules; production facilities; tools; batch size; batched run rate validation; capacity planning; cascade level; cascaded run rate validation; multimodule toolset; product/layer mix; robust processes; tool capacity calculations; Capacity planning; Costs; Data analysis; Lithography; Manufacturing; Mathematical model; Product design; Production facilities; Robustness; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing, 2003 IEEE International Symposium on
ISSN :
1523-553X
Print_ISBN :
0-7803-7894-6
Type :
conf
DOI :
10.1109/ISSM.2003.1243243
Filename :
1243243
Link To Document :
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