• DocumentCode
    2264901
  • Title

    Ultra-thin chip fabrication for next-generation silicon processes

  • Author

    Burghartz, Joachim N. ; Harendt, Christine ; Hoang, Tu ; Kiss, Astrid ; Zimmermann, Martin

  • Author_Institution
    Inst. fur Mikroelektron. Stuttgart, Stuttgart, Germany
  • fYear
    2009
  • fDate
    12-14 Oct. 2009
  • Firstpage
    131
  • Lastpage
    137
  • Abstract
    Ultra-thin chip technology is identified as an enabler for overcoming bottlenecks in microelectronics, such as 3D integration, and for leading to new applications, such as hybrid, flexible system-in-foil (SiF). This, however, calls for new techniques in fabricating very thin wafers or chips, in applying them to device integration processes and in assembly and packaging. The application to SiF requires that the ultra-thin chips feature excellent mechanical reliability and flexibility. This paper focuses on a recently introduced novel technology, called Chipfilmtrade, for fabricating ultra-thin chips. The technology consists of a pre-process Chipfilmtrade and a post-process Pick, Crack&Placetrade. Particular attention is paid to the design and characterization to the mechanical anchors that are broken in the Pick, Crack&Place process to singulate the thin chips. Also discussed is the characterization of the chip´s mechanical stability and flexibility.
  • Keywords
    assembling; electronics packaging; integrated circuit manufacture; 3D integration; Chipfilm; assembly; device integration; flexible system-in-foil; mechanical reliability; microelectronics; next-generation silicon processes; packaging; ultra-thin chip fabrication; Assembly; Chip scale packaging; Mechanical factors; Microelectronics; Power dissipation; Silicon; Stability; Substrates; Surface cracks; Thermal factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting, 2009. BCTM 2009. IEEE
  • Conference_Location
    Capri
  • ISSN
    1088-9299
  • Print_ISBN
    978-1-4244-4894-4
  • Electronic_ISBN
    1088-9299
  • Type

    conf

  • DOI
    10.1109/BIPOL.2009.5314128
  • Filename
    5314128