Title :
Built-in self-testing based on compressed 2-dimensional signature analysis
Author :
Chenxi, Cai ; Xiutan, Wang ; Yingning, Peng
Author_Institution :
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
Abstract :
The design of modern electronic systems demands high system reliability and maintainability. In order to perform fault detection, localization and isolation effectively, it is necessary to design a built-in self-testing (BIST) module specific to the corresponding system. This paper presents a BIST method based. on compressed 2-dimensional signature analysis. The principle of compression and performance of test are discussed in detail. Using the presented method, a high faulty coverage ratio (FCR) can be achieved with a short signature compressed in both time domain and space domain. Theoretical analysis shows that this method is reliable and it can be easily implemented in hardware
Keywords :
built-in self test; circuit reliability; fault location; logic testing; BIST module; built-in self-testing; compressed 2-dimensional signature analysis; fault detection; faulty coverage ratio; isolation; localization; maintainability; system reliability; Built-in self-test; Circuit faults; Circuit testing; Fault detection; Hardware; Maintenance; Performance analysis; Power system reliability; Shift registers; Time domain analysis;
Conference_Titel :
Radar, 2001 CIE International Conference on, Proceedings
Conference_Location :
Beijing
Print_ISBN :
0-7803-7000-7
DOI :
10.1109/ICR.2001.984853
