Title :
Tunneling times through dielectric stacks
Author :
Rutter, Natalia B. ; Polyakov, Sergey V. ; Lett, Paul ; Migdall, Alan
Abstract :
We measure the photon tunneling time through bandgaps of dielectric layer stacks with alternating refractive indices. We observe subtle structural changes in dielectric stacks drastically affecting photon traversal times, allowing for sub- and superluminal effects.
Keywords :
dielectric thin films; hafnium compounds; refractive index; titanium compounds; visible spectra; HfO2; TiO2; bandgaps; dielectric stacks; photon traversal times; photon tunneling time; refractive index; superluminal effects; Dielectric measurements; Dielectric thin films; Optical films; Optical refraction; Optical saturation; Optical variables control; Photonic band gap; Physics; Propagation delay; Tunneling; (310.6628) Subwavelength structures, nanostructures; (310.6860) Thin films, optical properties;
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
