TUGEN: an automatic test suite generator integrating data-flow and control-flow methods

Author

Wang, Jianguo ; Hao, Ruibing ; Wu, Jianping

Author_Institution

Dept. of Comput. Sci., Tsinghua Univ., Beijing, China

Volume

1

fYear

1998

fDate

7-11 Jun 1998

Firstpage

286

Abstract

This paper presents a new method and its implementation called TUGEN. This method integrates the features of data-flow and control-flow test. TUGEN is based on a formal model called EBE that specifies only the external behavior of a protocol. We introduce the unique input/output (UIO) sequence algorithm to determine the state and the concept of adaptive input/output (AIO) tree to solve the nondeterminism of a protocol. We also use the protocol constraint set to control the complexity of exploring space. Furthermore, we can optimally generate the test suite by simulant testing

Keywords

automatic testing; conformance testing; data flow computing; formal specification; protocols; sequences; AIO tree; EBE; TUGEN; UIO sequence algorithm; adaptive input/output; automatic test suite generator; conformance testing; control-flow methods; data-flow; external behavior; formal model; formal protocol specification; nondeterminism; protocol constraint set; simulant testing; unique input/output; Automata; Automatic control; Automatic generation control; Automatic testing; Computer science; Data analysis; Logic; Protocols; Space exploration;

fLanguage

English

Publisher

ieee

Conference_Titel

Communications, 1998. ICC 98. Conference Record. 1998 IEEE International Conference on

Conference_Location

Atlanta, GA

Print_ISBN

0-7803-4788-9

Type

conf

DOI

10.1109/ICC.1998.682688

Filename

682688