DocumentCode :
2265105
Title :
Optical interconnect operation with high noise immunity
Author :
Agarwal, D. ; Keeler, G.A. ; Nelson, B.E. ; Helman, N.C. ; Miller, D.A.B.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
fYear :
2002
fDate :
24-24 May 2002
Firstpage :
201
Abstract :
Summary from only given. We demonstrate the operation of a link with high immunity to supply and substrate noise. A total link power penalty of only 0.12 dB/ 100 mV of receiver supply noise was observed. Link performance was unaffected by substrate noise injection from a voltage controlled oscillator (VCO). This high immunity can be attributed to the differential nature of the receiver. The effect of supply noise and crosstalk on electrically single-ended receivers has been studied. To the best of our knowledge, however, this is the first demonstration of the operation of an entire chip-to-chip optical link with modulators and electrically differential receivers quantifying the effect of supply and substrate noise.
Keywords :
electro-optical modulation; multiprocessor interconnection networks; optical interconnections; optical links; optical noise; optical receivers; parallel architectures; photodiodes; substrates; voltage-controlled oscillators; 100 mV; chip-to-chip optical link; electrically differential receivers; electrically single-ended receivers; entire chip-to-chip optical link; high noise immunity; link performance; modulators; receiver supply noise; substrate noise; substrate noise injection; supply noise; total link power penalty; voltage controlled oscillator; Bit error rate; Circuit noise; Crosstalk; Digital circuits; Noise generators; Optical interconnections; Optical noise; Optical receivers; Testing; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
Type :
conf
DOI :
10.1109/CLEO.2002.1033618
Filename :
1033618
Link To Document :
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