Modeling and data processing for thin-film optical sensors

The paper presents a results of the development of metal clad waveguide (MCWG) sensors on thin-film structures Al/Nb₂O₅ and a sensor unit of angular type “Plasmontest” which is intended to create, process, and study optical signal reflected from the interface of the medium and thin-film sensor substrate. The device can be used as surface plasmon resonance (SPR) and MCWG sensors. The data processing includes noise suppression, interpolation of data, calculation of the points of minimum on reflectivity curves and generation of their angular position from time (sensorogramm). Thin-film technology of MCWG Al/Nb₂O₅ developed by us is presented too. As a demonstration of the capabilities of “Plasmontest” and MCWG Al/Nb₂O₅ sensors the experimental date of refractometric measuring are presented.