• DocumentCode
    2265212
  • Title

    Modeling and data processing for thin-film optical sensors

  • Author

    Lebyedyeva, Tetiana ; Frolov, Yuriy ; Kurlov, Serhiy ; Budnyk, Mykola ; Minov, Yuriy ; Sutkovyi, Pavlo ; Shpylovyi, Pavlo

  • Author_Institution
    Glushkov Inst. for Cybern., Kiev, Ukraine
  • Volume
    1
  • fYear
    2011
  • fDate
    15-17 Sept. 2011
  • Firstpage
    119
  • Lastpage
    124
  • Abstract
    The paper presents a results of the development of metal clad waveguide (MCWG) sensors on thin-film structures Al/Nb2O5 and a sensor unit of angular type “Plasmontest” which is intended to create, process, and study optical signal reflected from the interface of the medium and thin-film sensor substrate. The device can be used as surface plasmon resonance (SPR) and MCWG sensors. The data processing includes noise suppression, interpolation of data, calculation of the points of minimum on reflectivity curves and generation of their angular position from time (sensorogramm). Thin-film technology of MCWG Al/Nb2O5 developed by us is presented too. As a demonstration of the capabilities of “Plasmontest” and MCWG Al/Nb2O5 sensors the experimental date of refractometric measuring are presented.
  • Keywords
    aluminium; interpolation; niobium compounds; optical sensors; reflectivity; refractive index measurement; signal processing; surface plasmon resonance; thin film sensors; waveguides; Al-Nb2O5; MCWG sensor; SPR sensor; angular position generation; angular type plasmontest; data interpolation; data processing; metal clad waveguide sensor; noise suppression; optical signal processing; reflectivity curves; refractometric measurement; sensorogramm; surface plasmon resonance sensor; thin film optical sensor; thin film structures; Approximation methods; Metals; Optical sensors; Optical surface waves; Optical waveguides; Polynomials; data processing; modeling; optical sensor; thin-film structures;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Data Acquisition and Advanced Computing Systems (IDAACS), 2011 IEEE 6th International Conference on
  • Conference_Location
    Prague
  • Print_ISBN
    978-1-4577-1426-9
  • Type

    conf

  • DOI
    10.1109/IDAACS.2011.6072723
  • Filename
    6072723