Title :
Spectrum of the photorefractive CdTe:Ge response in the near infrared
Author :
Shcherbin, K. ; Shumelyuk, O. ; Odoulov, S. ; Kratzig, E.
Author_Institution :
Inst. of Phys., Kiev, Ukraine
Abstract :
Summary from only given. We show that photorefractive response of CdTe:Ge is especially sensitive to the wavelength. It is studied with a cw Ti:sapphire laser and with two cw YAG lasers operating at 1.06 /spl mu/m and 1.32 /spl mu/m.
Keywords :
II-VI semiconductors; cadmium compounds; germanium; impurity absorption spectra; infrared spectra; laser beam effects; photorefractive materials; 1.06 micron; 1.32 micron; Al/sub 2/O/sub 3/:Ti; CdTe:Ge; IR spectra; YAG; YAl5O12; cw Ti:sapphire laser; optical properties; photorefractive properties; photorefractive response; wavelength sensitive; Charge carrier processes; Four-wave mixing; Infrared spectra; Lighting; Nonlinear optics; Optical amplifiers; Optical mixing; Optimized production technology; Photorefractive effect; Semiconductor diodes;
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
DOI :
10.1109/CLEO.2002.1033626
