• DocumentCode
    2265337
  • Title

    Comparing RF linearity of npn and pnp SiGe HBTs

  • Author

    Seth, Sachin ; Cheng, Peng ; Grens, Curtis M. ; Cressler, John D. ; Babcock, Jeff ; Liu, Yun ; Kim, Jonggook ; Buchholz, Alan

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Tech, Atlanta, GA, USA
  • fYear
    2009
  • fDate
    12-14 Oct. 2009
  • Firstpage
    29
  • Lastpage
    32
  • Abstract
    The RF linearity characteristics of complementary (npn + pnp) SiGe HBTs are investigated with respect to bias and frequency dependence, for the first time. The differences in distortion performance between npn and pnp SiGe HBTs are examined. Overall, at low bias currents (e.g., for minimum RF noise), both devices exhibit similar linearity performance and power gain, while for higher bias currents (e.g., for maximum gain), the pnp SiGe HBT offers advantages over the npn SiGe HBT. The linearity of both the npn and the pnp SiGe HBTs in common-emitter configuration improves as operating frequency rises.
  • Keywords
    Ge-Si alloys; elemental semiconductors; heterojunction bipolar transistors; mixed analogue-digital integrated circuits; HBT; RF linearity; SiGe; power gain; Circuits; Distortion measurement; Drives; Geometry; Germanium silicon alloys; Heterojunction bipolar transistors; III-V semiconductor materials; Linearity; Radio frequency; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting, 2009. BCTM 2009. IEEE
  • Conference_Location
    Capri
  • ISSN
    1088-9299
  • Print_ISBN
    978-1-4244-4894-4
  • Electronic_ISBN
    1088-9299
  • Type

    conf

  • DOI
    10.1109/BIPOL.2009.5314146
  • Filename
    5314146