DocumentCode
2265337
Title
Comparing RF linearity of npn and pnp SiGe HBTs
Author
Seth, Sachin ; Cheng, Peng ; Grens, Curtis M. ; Cressler, John D. ; Babcock, Jeff ; Liu, Yun ; Kim, Jonggook ; Buchholz, Alan
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Tech, Atlanta, GA, USA
fYear
2009
fDate
12-14 Oct. 2009
Firstpage
29
Lastpage
32
Abstract
The RF linearity characteristics of complementary (npn + pnp) SiGe HBTs are investigated with respect to bias and frequency dependence, for the first time. The differences in distortion performance between npn and pnp SiGe HBTs are examined. Overall, at low bias currents (e.g., for minimum RF noise), both devices exhibit similar linearity performance and power gain, while for higher bias currents (e.g., for maximum gain), the pnp SiGe HBT offers advantages over the npn SiGe HBT. The linearity of both the npn and the pnp SiGe HBTs in common-emitter configuration improves as operating frequency rises.
Keywords
Ge-Si alloys; elemental semiconductors; heterojunction bipolar transistors; mixed analogue-digital integrated circuits; HBT; RF linearity; SiGe; power gain; Circuits; Distortion measurement; Drives; Geometry; Germanium silicon alloys; Heterojunction bipolar transistors; III-V semiconductor materials; Linearity; Radio frequency; Silicon germanium;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar/BiCMOS Circuits and Technology Meeting, 2009. BCTM 2009. IEEE
Conference_Location
Capri
ISSN
1088-9299
Print_ISBN
978-1-4244-4894-4
Electronic_ISBN
1088-9299
Type
conf
DOI
10.1109/BIPOL.2009.5314146
Filename
5314146
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