Title :
Ground truth roughness measurement for Sir-C/X-Sar images: a photogrammetric approach in the Montespertoli test site
Author :
Catani, F. ; Bianchi, F. ; Moretti, S.
Author_Institution :
Dept. of Earth Sci., Firenze Univ., Italy
Abstract :
Several ground truth measurement campaigns have been carried out on significant crop and hillslope portions of the Montespertoli X-SAX/SIR-C test site in order to gather data regarding vegetation cover, land-use, soil moisture and soil roughness. A new technique for the evaluation of the latter is presented, based on a completely automated terrestrial photogrammetric method. On chosen transects along meaningful directions on hillslopes of the area, a series of digital photographic stereopairs were taken with the help of a special double-camera instrument realized for the purpose. Afterwards a series of 1 by 1 meter DTMs were generated by the modeling software and then connected to each other. For the measurement and parameterization of the relative soil roughness the whole surveyed three-dimensional surface was considered and the classical statistical parameters were replaced with those generated by geostatistic methods in the framework of a self-similar surface characterization
Keywords :
geophysical techniques; remote sensing by radar; soil; spaceborne radar; surface topography measurement; synthetic aperture radar; terrain mapping; topography (Earth); Italy; Montespertoli test site; SAR; Sir-C; X-Sar; geophysical measurement technique; ground truth; hill; hillslope; land surface; photogrammetric approach; radar remote sensing; roughness; sloping terrain; soil roughness; spaceborne radar; stereopair; synthetic aperture radar; terrain mapping; terrestrial photogrammetric method; transect; Character generation; Crops; Instruments; Moisture measurement; Rough surfaces; Soil measurements; Soil moisture; Surface roughness; Testing; Vegetation mapping;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-6359-0
DOI :
10.1109/IGARSS.2000.858250