• DocumentCode
    2266188
  • Title

    Scale and orientation invariant 3D interest point extraction using HK curvatures

  • Author

    Akagündüz, Erdem ; Ulusoy, Ilkay

  • fYear
    2009
  • fDate
    Sept. 27 2009-Oct. 4 2009
  • Firstpage
    697
  • Lastpage
    702
  • Abstract
    Although they are orientation invariant, mean (H) and Gaussian (K) curvature values are essentially variant under scale and resolution changes. In order to overcome this fact, in this study, scale-spaces of the 3D surface and the curvature values are constructed. Then features with their scale information are sought within the scale-space. Thus, different from previous studies, H and K curvature values are obtained using constant threshold values and independent of the scale of the 3D surface. Also, 3D features are extracted with their sizes over the surface. Consequently, salient features extracted from a 3D surface are comparable to their identical but resized versions found on the scaled versions of the same 3D surface. In other words, metric sizes for each feature found over the surface are given and by this way complete scale and resolution invariance is assured. Moreover, robustness of feature extraction under scale and noise is tested. Also, the method is used for object recognition when a database is constructed by virtually resizing the Stuttgart database objects. The results are compared with the ones obtained when scale space is not used.
  • Keywords
    curve fitting; feature extraction; object recognition; 3D interest point extraction; 3D surface; Gaussian curvature value; HK curvature; constant threshold value; feature extraction; mean curvature value; metric size; object recognition; orientation invariant; scale information; scale-spaces; Computer vision; Data mining; Feature extraction; Information resources; Noise robustness; Object detection; Object recognition; Shape; Spatial databases; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision Workshops (ICCV Workshops), 2009 IEEE 12th International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4244-4442-7
  • Electronic_ISBN
    978-1-4244-4441-0
  • Type

    conf

  • DOI
    10.1109/ICCVW.2009.5457634
  • Filename
    5457634